This course provides an intensive introduction to the principles and practise of scanning and transmission electron microscopy, polarised transmitted light microscopy and reflected light microscopy for non-specialists in the field of physical sciences.  

Course components include:

1. Specimen preparation methods;

2. Petrographic/metallographic light microscopy using linear-polarised transmitted light and reflected light; and

3. Introductory scanning and transmission electron microscopy 

Upon successful completion of this course, students will:

1. Understand the principles of polarised light optics as applied to microscopy of transparent and opaque inorganic samples;
2. Know the basics of crystallography and its control of directional variation of the optical properties in crystalline materials;
3. Understand the principles of electron optics, signal generation in SEM, image formation and diffraction in TEM; and
4. Have knowledge of a range of sample preparation methods for transmitted and reflected light, and scanning and transmission electron microscopies. 

UG assessment will be based on:

1. Eight assessable practicals total to 60% (LO 1, 2, 3 and 4); and

2. A final exam worth 40% (LO 1, 2, 3 and 4).

A minimum completion of 96 units of physical or materials science or equivalent, including some laboratory components, before enrolling in this course. Short courses on the theory and practice of microscopy run by the Centre are incompatible with this course.